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SpeedFam continues developing epoch-making processes and equipment.

Dry Chemical Planarization (DCP) is our numerically controlled flattening system. DCP enables non-contact, zero distortion processing by vapor phase chemical etching reaction of plasma. This system was specially developed to eliminate wafer damage from charge-up by applying down stream plasma. DCP is extremely precise and utilizes an optimized original numerically controlled program to realize the most stabile processing. Applications include high end semiconductor-related requirements for the next generation flatness specifications. DCP can easily process large diameter parts in excess of 300mm. This clean and dry process also ameliorates production environments.

Please monitor our progress at this web site for future announcements of many new products.
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DCP
Controlling down stream plasma is a dry etch method to achieve super exact tolerances without surface damage on silicon wafers, SOI layers, and photomasks which cannot be achieved by any conventional polishing process method.
Flat Chaser
The SpeedFam Flat Chaser is a measurement system for the plate and the polishing pads used in CMP and double side processing (upper and lower). Quantitative measurements of the degree of flatness on these large surfaces are realized for effective and efficient quality control of your process.
 
 
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